Lecture 15: Alignment, PatMax, Distance Field, Filtering and Sub-Sampling (US 7,065,262)

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MIT 6.801 Machine Vision, Fall 2020 Instructor: Berthold Horn View the complete course: https://ocw.mit.edu/6-801F20 YouTube Playlist: https://www.youtube.com/playlist?list=PLUl4u3cNGP63pfpS1gV5P9tDxxL_e4W8O In this lecture, we discuss another patent on object inspection and pose estimation, known as PatMAx. We look at computing distance to lines to perform better edge detection and the role of sparse convolution for multiscale systems that perform filtering. License: Creative Commons BY-NC-SA More information at https://ocw.mit.edu/terms More courses at https://ocw.mit.edu Support OCW at http://ow.ly/a1If50zVRlQ We encourage constructive comments and discussion on OCW’s YouTube and other social media channels. Personal attacks, hate speech, trolling, and inappropriate comments are not allowed and may be removed. More details at https://ocw.mit.edu/comments. Speakers: Berthold Horn

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